ELECTRON MICROSCOPY AND SCANNING PROBE MICROSCOPY: INTRODUCTION TO SEM, TEM AND AFM

The course is included within the complementary training activities for the PhD programme in Science and Technology of Bio and Nanomaterials. Students will study scientific topics in the field of physical chemistry, science and engineering of (nano-)materials, both from a theoretical and an experimental point of view. Nowadays, the analysis and characterization of samples using electron microscopy (TEM and SEM) and atomic force microscopy (AFM) constitute a pivotal investigative tool in the field of materials science. In fact, these experimental techniques allow to visualize, each one with its own peculiarities, the topography of the samples with nanometer spatial resolution, combining measurements of chemical composition, electrical properties and mechanical properties of the surfaces. The course is aimed at giving a broad overview of the development and use of these experimental techniques, progressively introducing the specific characteristics of the instruments and the specific interactions of the sample surface with the utilized probes (i.e., AFM tips or electrons). The goal is to allow the student to use atomic force and electron microscopes with awareness.

The student will be able to:
- describe the basic physical principles used in AFM and electron microscopy (EM) imaging.
- Provide correct interpretation of the data collected by AFM and EM,
- describe other microscopy techniques that have been developed on the basis of AFM and EM,
- consider the limitations of the techniques and select the most suitable method to address a specific research task.
- integrate the knowledge acquired during this course into scientific discussions.
- can apply their knowledge and understanding, and problem solving abilities in new or unfamiliar environments within broader (or multidisciplinary) contexts related to their field of study.

Basic knowledge of optics, physics of waves, electromagnetism, materials science and nanomaterials.

Part I (15h). Atomic force microscopy (AFM):
- Introduction to scanning probe microscopy.
- The harmonic oscillator and the characterization of the AFM cantilever motion.
- Force between the AFM probe and the sample surface.
- AFM instrumentation.
- AFM modes: static (contact) and dynamic AFM.
- AFM for analysis of topography.
- Work function, contact potential and Kelvin Probe AFM.
- Mapping of mechanical properties using force-distance curves.
- High-speed AFM for the study of biological samples.
- Combination of AFM and optical spectroscopies: near-field microscopies.

Part 2 (15h). Scanning and transmission electron microscopies:
- Introduction to microscopy: fundamentals of light microscopy.
- Geometrical optics.
- Visible light and electron features: a comparison.
- Diffraction and spatial resolution: limitations of light spectroscopy.
- Electron guns and electron lenses.
- The transmission electron microscope.
- The scanning electron microscope.
- Spectroscopies in the electron microscope: energy dispersive X-ray spectrometry (EDS or EDX), electron energy loss spectroscopy (EELS), electron backscatter diffraction (EBSD).

J. Goldstein et al., "Scanning Electron Microscopy and X-ray Microanalysis", Springer, Fourth Edition, 2018.
D.B. Williams and C.B. Carter, "Transmission Electron Microscopy, A text for materials scientists", Springer, 2009
B. Voigtländer, “Atomic force microscopy”, Springer, Second Edition, 2019.
A. Toshio, "High-speed atomic force in biology", Springer Edition, 2022

The assessment of learning takes place through a short oral presentation (Power Point slides). The exam is aimed at verifying and evaluating the student's ability to present and discuss an application of at least one experimental technique covered during the course. The student must prepare his/her presentation based on the results of a scientific article of his/her choice, published in a peer-reviewed scientific journal. The student must propose the selected scientific article to the teacher, who will confirm its adequacy and compliance with the topics of the course. The student must demonstrate critical thinking and the ability to present the topic in a formal and concise way, using an appropriate scientific language. In case of a positive outcome of the test, the effectiveness of the oral presentation, the adequacy and correctness of the contents of the presentation will be evaluated by the teacher with a score from 18 to 30. In case of a negative outcome of the test, an insufficient grade will be assigned.

Teaching is organized in lectures. PowerPoint slides will be used during the lessons. The material for teaching will be shared with the students.

Accessibility, Disability and Inclusion

Accommodation and support services for students with disabilities and students with specific learning impairments:
Ca’ Foscari abides by Italian Law (Law 17/1999; Law 170/2010) regarding supportservices and accommodation available to students with disabilities. This includes students with mobility, visual, hearing and other disabilities (Law 17/1999), and specific learning impairments (Law 170/2010). In the case of disability or impairment that requires accommodations (i.e., alternate testing, readers, note takers or interpreters) please contact the Disability and Accessibility Offices in Student Services: disabilita@unive.it.

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