MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES - MOD.1
- Academic year
- 2024/2025 Syllabus of previous years
- Official course title
- MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES - MOD.1
- Course code
- CM1327 (AF:509742 AR:291684)
- Modality
- On campus classes
- ECTS credits
- 6 out of 12 of MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES
- Degree level
- Master's Degree Programme (DM270)
- Educational sector code
- CHIM/02
- Period
- 2nd Semester
- Course year
- 1
- Moodle
- Go to Moodle page
Contribution of the course to the overall degree programme goals
that describes some of the common approaches to characterise materials.
The aim of the course is to give the basic of crystallography and diffraction as a tool to characterize solid state materials.
Learning objectives involve understanding of basic principles of crystallography and X-ray diffraction and applying these principles to master the
underlying concepts of structural characterisation.
The basic principle of symmetries in solids will be outlined and developed in order to have a quantitative tool in the characterisation of materials. These knowledges will be then used to interpret the X-ray diffraction data. At the end of the course the students will be able to identify crystalline phases present in any kind of material, to determine the mean particle size, o understand the structural modifications due, for example, to doping.
Expected learning outcomes
1. to learn the main methods used in crystallography;
2. to learn the standard methods used in X-ray diffraction to study materials and specially nano-structured systems;
Linking material learned in class to modern structural characterisation techniques and research will be highlighted to
give you opportunities to see how X-ray diffraction is solving current, real-world problems.
Pre-requirements
experience with calculus. In addition, students should be familiar with the concepts learned in calculus-based physics.
Contents
Interaction X-photon-matter, Instrumentation, diffraction techniques:single crystal and powder methods.
Application of X-ray diffraction in the study of hard and soft matters: Scherrer equation, Rietveld method.
Referral texts
Marc De Graef, Michael McHenry, Structure of Materials, Cambridge University Press, 2012.
Pecharsky Vitalij, Zavalij Peter, Fundamentals of Powder Diffraction and Structural Characterization of Materials,Springer. Berlin, 2008.
Fultz Brent, Howe James, Transmission Electron Microscopy and Diffractometry of Materials, Springer 4th edition 2013.
Ray F. Egerton Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM, Springer Nature , 2nd edition, 2016
Assessment methods
The students will be asked to solve some numerical exercises related to the arguments explained during lessons. Furthermore the students will be asked to answer some theoretical questions about topics developed during classes.
Teaching methods
Teaching language
Further information
Enrolling for the examination is allowed only to students that attended at least 80% of classes.
Accessibility, Disability and Inclusion
Accommodation and support services for students with disabilities and students with specific learning impairments:
Ca’ Foscari abides by Italian Law (Law 17/1999; Law 170/2010) regarding supportservices and accommodation available to students with disabilities. This includes students with mobility, visual, hearing and other disabilities (Law 17/1999), and specific learning impairments (Law 170/2010). In the case of disability or impairment that requires accommodations (i.e., alternate testing, readers, note takers or interpreters) please contact the Disability and Accessibility Offices in Student Services: disabilita@unive.it.
Type of exam
2030 Agenda for Sustainable Development Goals
This subject deals with topics related to the macro-area "Climate change and energy" and contributes to the achievement of one or more goals of U. N. Agenda for Sustainable Development